atomic force microscope / for analysis / topography

Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and more consistent collection of high-quality AFM images regardless of user skill level. It also provides a wide range of uncommon features such as Q control, tip calibration, and 3D overly for enhanced measurements and data processing.

1. RealTuneII Auto Tuning Functions for Optimal Measurement Parameters
The improved auto tuning function systematically and efficiently monitors sample topography, scanning area, the cantilever, and the scanner to determine the best operating conditions. As the measurement parameters are optimized, the cantilever?s vibration amplitude and operation frequency are automatically adjusted based on the sample and cantilever type. The new and improved auto tuning algorithm offers reliable and precise images with a simple point-and-click!

One-click automatic measurement