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Atomic Force Microscope / Scanning Probe / Measurement / High-resolution

atomic force microscope / scanning probe / measurement / high-resolution

Dimension FastScan Pro

Vnation JSC

atomic force microscope / scanning probe / measurement / high-resolution
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  • Type:

    atomic force, scanning probe

  • Technical applications:

    measurement

  • Other characteristics:

    high-resolution, high-precision

? High-Resolution Imaging & Most Precise Measurements
? Unique, Quantitative Results, Whatever You Measure
? Easy to Use, Making Every User an AFM Expert
? Most Reliable Platform and Unrivalled Support

High-Resolution Imaging & Most Precise Measurements
PeakForce Tapping? enables consistent, high-resolution AFM imaging.

Unique technology enables pinpoint force to any atom on your sample.
The most precise probe-sample control permits widest range of sample types, from soft polymers, thin films and electrical samples to very hard materials.

Để lại bình luận

Go to the Bruker Nano Surfaces website for more information
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