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Atomic Force Microscope / For Analysis / High-resolution / For Nanoindentation Hardness

atomic force microscope / for analysis / high-resolution / for nanoindentation hardness

Dimension Icon®

Vnation JSC

atomic force microscope / for analysis / high-resolution / for nanoindentation hardness
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  • Type:

    atomic force

  • Technical applications:

    for analysis

  • Other characteristics:

    high-resolution, for nanoindentation hardness, for scratch testing, for material analysis

The Dimension Icon, manufactured by Bruker, is an atomic force microscope that has been created to look at objects on the atomic level. It provides picture of atoms on or in surfaces. It is also integrated with feedback alignment tools, high-resolution camera, XY positioning, imaging and nanoScope? software, custom user-programmable scripts and exclusive sensor design. Moreover, it enables quick, accessible, reliable and efficient results for the nano scale researchers.

This device is used in a wide range of applications such as material mapping, nanomanipulation, electrical characterization, heating and cooling process. The system has been designed to provide minimal noise consumption and maximum productivity.

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View catalogue Go to the Bruker Nano Surfaces website for more information
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