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Analysis Microscope / 3D / Real-time / Scanning Electron With Focused Ion Probe

analysis microscope / 3D / real-time / scanning electron with focused ion probe

NX9000

Vnation JSC

analysis microscope / 3D / real-time / scanning electron with focused ion probe
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  • Technical applications:

    for analysis

  • Other characteristics:

    3D, real-time, scanning electron with focused ion probe

  • Spatial resolution:

    4 nm, 1.6 nm, 2.1 nm

The newly developed FIB-SEM system from Hitachi, the NX9000 incorporates an optimized layout for true high resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analysis. The NX9000 FIB-SEM system allows the highest precision in material processing for a wide range of areas relating to advanced materials, electronic devices, biological tissues and a multitude of other applications.

Features
SEM column and FIB column are orthogonally arranged to optimize column layout for 3D structural analysis.
Combination of high brightness cold field emission electron source and high sensitivity optics support analysis of a wide range of materials from magnetic materials to biological tissues.
Micro-sampling system and Triple Beam system allow high quality sample preparation for TEM and atom probe applications.

Để lại bình luận

Go to the Hitachi High-Technologies Europe website for more information
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