1. Home
  2. Metrology - Laboratory
  3. Inspection and Monitoring
  4. FEM microscopes, X-ray microscopes, Electron microscopes
  5. analysis microscope / computerized / scanning electron with focused ion probe
Analysis Microscope / Computerized / Scanning Electron With Focused Ion Probe

analysis microscope / computerized / scanning electron with focused ion probe

NX2000

Vnation JSC

analysis microscope / computerized / scanning electron with focused ion probe
Contact us for advice solutions and equipment provider
captcha contact product

  • Technical applications:

    for analysis

  • Other characteristics:

    computerized, scanning electron with focused ion probe

  • Spatial resolution:

    4 nm, 60 nm

Toward the ultimate TEM sample preparation system

FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials. An ever-increasing demand for ultrathin TEM lamellas without artifacts during FIB processing require the best in ion and electron optics technologies.
Hitachi's NX2000 high performance FIB and high resolution SEM system with its unique sample orientation control* and triple beam* technologies, supports high throughput, and high quality TEM sample preparation for cutting edge applications.
* Option

Để lại bình luận

Go to the Hitachi High-Technologies Europe website for more information
Products relative
Conventional microscopes
macro objective lens / telecentric / high-resolution / machine vision

macro objective lens / telecentric / high-resolution / machine vision

CA-L series
Focal length: 12 mm - 50 mm
zoom objective lens

zoom objective lens

VH series
Focal length: 95 mm - 276 mm
microscope confocal device

microscope confocal device

Dragonfly
The game-changer in confocal microscopy - with the Andor Dragonfly you can image at an unrivalled, multi-modal combination of speed, sensitivity and confocality. The Dragonfly naturally benefits from Andor EMCCD and sCMOS technologies, ...
laser illuminator / visible / portable / inspection

laser illuminator / visible / portable / inspection

DSD2
Banner laser-structured lights generate improved gains than LEDs and a wider range in opposed-mode sensing systems due to integrated Class 2 modulated visible laser diode emitters. The contracted effective beam detects low-sized objects ...
stand-alone camera control unit / for microscopy

stand-alone camera control unit / for microscopy

DS-L4
Nikon's newest and most versatile microscope camera control unit is easy to see and easy to use. The digital Sight DS-L3 has a large built-in touch-screen monitor that allows setting and operation of the camera head at the touch of a ...
IR objective lens

IR objective lens

MPLAPON
The Olympus UIS Objective Lenses manufactured by MPLAPON ensures satisfactory and flexible optical performance under visible light to an almost infrared light. A number of lens choices are available and depend on users' specific requirements.
high-resolution objective lens

high-resolution objective lens

MPLAPON-Oil
Our MPLAPON-Oil Plan Apochromat oil immersion objective provides the highest level of chromatic correction and resolution capability available from Olympus. Outstanding Numerical Aperture, 1.4, ensures unparalleled resolution. M Plan ...
plan achromatic objective lens

plan achromatic objective lens

MPLN series
MPLN Plan Achromat lens series is designed to limit effects of chromatic and spherical aberration. Achromatic lenses are corrected to bring two wavelengths to focus in the same plane. Olympus made this device that will match for bright ...
FEM microscopes, X-ray microscopes, Electron microscopes
compact microscope / variable pressure scanning / scanning electron

compact microscope / variable pressure scanning / scanning electron

FlexSEM 1000
The FlexSEM 1000 VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package. Cutting-edge technology and circuitry provides unrivaled ...
atomic force microscope / for analysis / high-resolution / transmission electron

atomic force microscope / for analysis / high-resolution / transmission electron

H-9500
Spatial resolution: 0.18, 0.1 nm
analysis microscope / 3D / real-time / scanning electron with focused ion probe

analysis microscope / 3D / real-time / scanning electron with focused ion probe

NX9000
Spatial resolution: 2.1, 1.6, 4 nm
analysis microscope / computerized / scanning electron with focused ion probe

analysis microscope / computerized / scanning electron with focused ion probe

NX2000
Spatial resolution: 4, 60 nm
atomic force microscope / for analysis / topography

atomic force microscope / for analysis / topography

AFM5000II
Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and ...
optical microscope / measurement / high-resolution / 3D

optical microscope / measurement / high-resolution / 3D

ContourGT-K
Uncompromised Imaging and Metrology for Widest Range of Surfaces Combining exceptional profiling performance, operator convenience, and affordability into one bench top instrument The ContourGT-K 3D Optical Microscope sets a new industry ...
atomic force microscope / for analysis / high-resolution / for nanoindentation hardness

atomic force microscope / for analysis / high-resolution / for nanoindentation hardness

Dimension Icon®
The Dimension Icon, manufactured by Bruker, is an atomic force microscope that has been created to look at objects on the atomic level. It provides picture of atoms on or in surfaces. It is also integrated with feedback alignment tools, ...
atomic force microscope / scanning probe / measurement / high-resolution

atomic force microscope / scanning probe / measurement / high-resolution

Dimension FastScan Pro
? High-Resolution Imaging & Most Precise Measurements ? Unique, Quantitative Results, Whatever You Measure ? Easy to Use, Making Every User an AFM Expert ? Most Reliable Platform and Unrivalled Support High-Resolution Imaging & ...
Endoscopes, Borescopes, Fiberscopes, Videoscopes
articulated videoscope

articulated videoscope

IPLEX NX
The advanced IPLEX NX videoscope is engineered for fast and thorough remote visual inspection, packed with a host of features to increase the probability of flaw detection and damage analysis in less time - even in the most inaccessible ...
flexible videoscope / industrial

flexible videoscope / industrial

IPLEX FX
Diameter: 6, 6.2, 4 mm
remote visual inspection videoscope / flexible / portable / industrial

remote visual inspection videoscope / flexible / portable / industrial

IPLEX RX/ IPLEX RT
Diameter: 4, 6 mm
flexible videoscope / portable / industrial / for remote visual inspection

flexible videoscope / portable / industrial / for remote visual inspection

IPLEX UltraLite
Diameter: 4, 6 mm
digital inspection system / video

digital inspection system / video

ReVision II plus
LEONARDO: Leonardo is the main outfitted edition of our video camera variety. It is obtainable in two dissimilar dimensions: 100 (field of visualization 100x130mm) and 75 (field of visualization 75x90mm) and, generally used for rotogravure ...
NIR borescope / for cracker furnace / for steam reformer

NIR borescope / for cracker furnace / for steam reformer

NIR-B 3XR
Thermal Imaging Reformer & Cracker Tube Furnaces - NIR Borescope (NIR-B) 3XR The NIR Borescope (NIR-B) 3XR is a short wavelength radiometric infrared borescope imaging camera for steam reformer and cracker tube continuous temperature ...
NIR borescope / fixed / industrial

NIR borescope / fixed / industrial

+600 °C ... +1 800 °C | NIR
The NIR Borescope is used for measuring temperature profiles in furnaces. It gives the operator a high-resolution geometric image of the process, which means that a live temperature value can be obtained from any area of focus on the ...
flexible videoscope / portable / industrial

flexible videoscope / portable / industrial

TKES 10 series
The TKES 10 Endoscopes series by SKF is designed for an easy and speedy inspection. It includes a video function. Endoscopes from SKF are high quality inspection tools for machinery internal inspection. The lessen the need of machinery ...
Partners