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Atomic Force Microscope / For Analysis / High-resolution / Transmission Electron

atomic force microscope / for analysis / high-resolution / transmission electron

H-9500

Vnation JSC

atomic force microscope / for analysis / high-resolution / transmission electron
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  • Type:

    atomic force

  • Technical applications:

    for analysis

  • Other characteristics:

    high-resolution, transmission electron

  • Spatial resolution:

    0.1 nm, 0.18 nm

The H-9500 is a 100-300 kV TEM with LaB6 electron gun. This is a user-friendly workhorse for atmoic-resolution TEM imaging and routine structural characterization. The excellent imaging capability also makes the H-9500 a platform for in-situ TEM. Various Hitachi in-situ heating TEM specimen holders* enable the imaging of dynamic structural changes at elevated temperatures. A special version for gas environmental in situ TEM is available.

Features
User-friendly operation

Windows? compatible GUI design.
High specimen throughput, 1 minute for specimen exchange and 5 minutes for voltage ramp up (300 kV) and beam on.

Stable high resolution microscopy

Point-to-point resolution of 0.18nm and lattice resolution of 0.1nm.
A stable 5-axis eucentric goniometer stage.

Excellent performance reliability

Field-proven 10-stage accelerator gun design.
High voltage resistor cable design.

Valuable optional accessories

Compatible specimen holder for use with Hitachi TEM, FIB and STEM systems.
A variety of specimen holders that provide heating, cooling and gas-injection capabilities for atomic resolution dynamic studies.

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View catalogue Go to the Hitachi High-Technologies Europe website for more information
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