spectrum analyzer

30? degrees full cone acceptance without sample rotation
Spin-resolved MDC without sample rotation
Patent pending
Improved ky accuracy (resolution better than 0.1?)
Time saving (electronic defl ection is faster than rotation)
Matrix element effects are avoided by keeping sample fixed
Manipulator requirements are reduced
Ensures same spot for all k//
With the new DA30, we are proud to present the world?s first hemispherical analyser using deflectors that enables angular scans in two dimensions in k-space without tilting the sample.

Spin Scan
A major advantage of the MCP/CCD and Spin detection combination is that the parallel angular detection can be used to ensure that the spin-resolved measurement is performed at the desired point in k-space. In the previous Scienta analysers, this has been
acheived by fi rst recording a parallel ARPES spectrum with the MCP/CCD detector and then, without tilting the sample, recording a spin-resolved spectrum for the
center of that spectrum.

With the new analyser concept deflectors have been added. This can be used to record
spin-resolved spectra for all points of the recorded ARPES spectrum. Different lines can of course be combined to cover the whole plane in ?x-E-space.